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April 8, 2009

Digital Lightwave launches APT test option for NIC platform products

The new feature enables testing of all STSs/AU containers within a SONET/SDH signal

By CBR Staff Writer

Digital Lightwave, a provider of optical networking test equipment and technology, has launched the All Path Testing test option for NIC platform products.

Digital Lightwave’s portable Network Information Computers (NIC) are software-based, modular products that combine a multitude of test functions in a single integrated system, including OTN, SONET/SDH, next-generation (VCAT, LCAS, GFP), PDH/T-carrier, ATM, ethernet 10/100/1000M, 1GigE and 10GigE LAN/WAN/FEC, optical spectrum analyzer and Jitter/Wander analysis.

According to Digital Lightwave, this new feature will enable testing of all STSs/AU containers within a SONET/SDH signal, up to 192 simultaneous tests at OC-192 or STM-64.

All Path Testing (APT) can operate with mixed mapping types for testing of today’s networks and includes auto-configure and simultaneous service disruption measurement. The new feature is available as a test option for the NIC platform’s NextGeneration Multi-Rate (NGMR) modules.

Doyle Mills, director of product marketing for Digital Lightwave, said: Testing today’s large cross-connects and multi-service provisioning platforms (MSPP) with many ports and tributaries have previously required multiple test sets or many extra days of testing with a single instrument. Our new All Path Testing feature, in conjunction with the NIC platform’s scalability and multi-channel testing capabilities, offer exactly what network operators need to efficiently deploy and maintain complex networks.

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