Nanometrics, a supplier of a leading supplier of solutions for advanced process control has acquired Germany-based Nanda Technologies for $23m.
US based Nanda Nanometrics has developed a high-throughput, high-sensitivity defect inspection technology for semiconductor manufacturing and the acquisition will add macro defect inspection technology to its portfolio of metrology offerings.
Nanda’s SPARK technology captures full-wafer surface inspection images at high-volume production speeds – allowing customers to achieve precise wafer inspection and 100% device sampling for today’s most advanced technology nodes.
The SPARK platform supports a wide range of surface materials and geographies and it will give a boost to the metrology segments currently served by Nanometrics’ optical process control products.
Nanometrics’ president and CEO Timothy Stultz said Nanda’s unique technology, product platform and proprietary analytical software provide an ideal complement to Nanometrics’ optical metrology business.
"This acquisition supports our strategy to expand our served markets and focus on the fastest-growing segments of process control," Stultz said.
"The significant competitive advantages and high customer value of the SPARK system, as well as the synergies with our existing product portfolio, will make this acquisition a meaningful contributor to our business within the next few years."
