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Technology / AI and automation

GENRAD PLANS BETA TEST OF GR300 EARLY 1988

GenRad Inc, Milpitas, California is planning a major new generation VLSI test system to be marketed as the GR300 and has been designed to offer significant additional capability over existing systems: it is currently undergoing system integration at the firm’s Semiconductor Test facility in Milpitas, and is planned for beta site installations early in 1988, with customer deliveries following in late 1988; it features a comprehensive resource per pin architecture for high accuracy and timing system capability, and is being designed for test and clock rates of 160MHz on up to 512 split pins, with system accuracy of plus or minus 150pS, and the timing system, is available on a per pin basis, can perform time set switching on the fly, with up to 32 separate time sets; for performance and accuracy, water cooling will be used in the test head of the GR300.

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